Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

406 pages | Dec 12, 2007 |ISBN:052155490X | PDF | 14.8 Mb

The use of scanning tunneling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is also discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This book will interest graduate students and researchers in condensed matter physics and material science.

Download Links (14.8 Mb)

http://hotfile.com/dl/71172144/ab556df/9780511534829_9780521554909.rar.html

Mirror:

http://www.fileserve.com/file/J5NVjWF